| #
ed68cf16 |
| 27-Jun-2023 |
Jon Lin <jon.lin@rock-chips.com> |
mtd: spinand: Fix the error method for judging flash ECC
The former method makes ECC effective value decreased from 4 to 1.
Change-Id: Iaab3d587d4f0649b3affc8802c6a818843fbc730
Signed-off-by: Jon L
mtd: spinand: Fix the error method for judging flash ECC
The former method makes ECC effective value decreased from 4 to 1.
Change-Id: Iaab3d587d4f0649b3affc8802c6a818843fbc730
Signed-off-by: Jon Lin <jon.lin@rock-chips.com>
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| #
81afcfe1 |
| 15-Oct-2021 |
Jon Lin <jon.lin@rock-chips.com> |
mtd: spinand: rework detect procedure for different READ_ID operation
Currently there are 3 different variants of read_id implementation:
1. opcode only. Found in GD5FxGQ4xF.
2. opcode + 1 addr byte
mtd: spinand: rework detect procedure for different READ_ID operation
Currently there are 3 different variants of read_id implementation:
1. opcode only. Found in GD5FxGQ4xF.
2. opcode + 1 addr byte. Found in GD5GxGQ4xA/E
3. opcode + 1 dummy byte. Found in other currently supported chips.
Original implementation was for variant 1 and let detect function
of chips with variant 2 and 3 to ignore the first byte. This isn't
robust:
1. For chips of variant 2, if SPI master doesn't keep MOSI low
during read, chip will get a random id offset, and the entire id
buffer will shift by that offset, causing detect failure.
2. For chips of variant 1, if it happens to get a devid that equals
to manufacture id of variant 2 or 3 chips, it'll get incorrectly
detected.
This patch reworks detect procedure to address problems above. New
logic do detection for all variants separatedly, in 1-2-3 order.
Since all current detect methods do exactly the same id matching
procedure, unify them into core.c and remove detect method from
manufacture_ops.
Link: https://lore.kernel.org/linux-mtd/20200208074439.146296-1-gch981213@gmail.com
Change-Id: Ib06417c8e8c7e9d58be1eb3549468bfcbd74350d
Signed-off-by: Jon Lin <jon.lin@rock-chips.com>
show more ...
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