1 /* SPDX-License-Identifier: BSD-2-Clause */ 2 /* 3 * Copyright (c) 2014, STMicroelectronics International N.V. 4 */ 5 #ifndef CORE_PTA_TESTS_MISC_H 6 #define CORE_PTA_TESTS_MISC_H 7 8 #include <compiler.h> 9 #include <tee_api_types.h> 10 #include <tee_api_defines.h> 11 12 /* basic run-time tests */ 13 TEE_Result core_self_tests(uint32_t nParamTypes, 14 TEE_Param pParams[TEE_NUM_PARAMS]); 15 16 TEE_Result core_fs_htree_tests(uint32_t nParamTypes, 17 TEE_Param pParams[TEE_NUM_PARAMS]); 18 19 TEE_Result core_mutex_tests(uint32_t nParamTypes, 20 TEE_Param pParams[TEE_NUM_PARAMS]); 21 22 #ifdef CFG_LOCKDEP 23 TEE_Result core_lockdep_tests(uint32_t nParamTypes, 24 TEE_Param pParams[TEE_NUM_PARAMS]); 25 #else 26 static inline TEE_Result core_lockdep_tests( 27 uint32_t nParamTypes __unused, 28 TEE_Param pParams[TEE_NUM_PARAMS] __unused) 29 { 30 return TEE_ERROR_NOT_SUPPORTED; 31 } 32 #endif 33 34 TEE_Result core_aes_perf_tests(uint32_t param_types, 35 TEE_Param params[TEE_NUM_PARAMS]); 36 37 #endif /*CORE_PTA_TESTS_MISC_H*/ 38