Searched hist:"754 e71e850cb09d53543846fbed74cc5a1491c76" (Results 1 – 3 of 3) sorted by relevance
| /rk3399_rockchip-uboot/test/dm/ |
| H A D | test-uclass.c | 754e71e850cb09d53543846fbed74cc5a1491c76 Wed Apr 15 11:07:19 UTC 2015 Przemyslaw Marczak <p.marczak@samsung.com> dm: test: Add tests for device's uclass platform data
This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
* uclass driver sets: .per_device_platdata_auto_alloc_size field
* the devices's: dev->uclass_platdata is non-NULL
- Test: dm_test_autobind_uclass_pdata_valid - this tests:
* if the devices's: dev->uclass_platdata is non-NULL
* the structure of type 'dm_test_perdev_uc_pdata' allocated at address
pointed by dev->uclass_platdata. Each structure field, should be equal
to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
|
| H A D | core.c | 754e71e850cb09d53543846fbed74cc5a1491c76 Wed Apr 15 11:07:19 UTC 2015 Przemyslaw Marczak <p.marczak@samsung.com> dm: test: Add tests for device's uclass platform data
This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
* uclass driver sets: .per_device_platdata_auto_alloc_size field
* the devices's: dev->uclass_platdata is non-NULL
- Test: dm_test_autobind_uclass_pdata_valid - this tests:
* if the devices's: dev->uclass_platdata is non-NULL
* the structure of type 'dm_test_perdev_uc_pdata' allocated at address
pointed by dev->uclass_platdata. Each structure field, should be equal
to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
|
| /rk3399_rockchip-uboot/include/dm/ |
| H A D | test.h | 754e71e850cb09d53543846fbed74cc5a1491c76 Wed Apr 15 11:07:19 UTC 2015 Przemyslaw Marczak <p.marczak@samsung.com> dm: test: Add tests for device's uclass platform data
This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
* uclass driver sets: .per_device_platdata_auto_alloc_size field
* the devices's: dev->uclass_platdata is non-NULL
- Test: dm_test_autobind_uclass_pdata_valid - this tests:
* if the devices's: dev->uclass_platdata is non-NULL
* the structure of type 'dm_test_perdev_uc_pdata' allocated at address
pointed by dev->uclass_platdata. Each structure field, should be equal
to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
|