29 static int eb = 8;  variable
30 module_param(eb, int, S_IRUGO);
31 MODULE_PARM_DESC(eb, "eraseblock number within the selected MTD device");
49 static int check = 1;
104 		addr = (loff_t)(ebnum + 1) * mtd->erasesize - pgcnt * pgsize;  in check_eraseblock()
111 		pr_err("single bit flip occurred at EB %d "  in check_eraseblock()
114 		pr_err("error %d while reading EB %d, "  in check_eraseblock()
120 		pr_err("failed to read %zd bytes from EB %d, "  in check_eraseblock()
127 		pr_err("read wrong data from EB %d\n", ebnum);  in check_eraseblock()
133 			pr_info("re-try reading data from EB %d\n",  in check_eraseblock()
158 		addr = (loff_t)(ebnum + 1) * mtd->erasesize - pgcnt * pgsize;  in write_pattern()
163 		pr_err("error %d while writing EB %d, written %zd"  in write_pattern()
194 	       ebcnt, eb, eb + ebcnt - 1, dev);  in tort_init()
207 	if (mtd->writesize == 1) {  in tort_init()
249 		if (!(i & 1)) {  in tort_init()
260 	err = mtdtest_scan_for_bad_eraseblocks(mtd, bad_ebs, eb, ebcnt);  in tort_init()
265 	while (1) {  in tort_init()
269 		err = mtdtest_erase_good_eraseblocks(mtd, bad_ebs, eb, ebcnt);  in tort_init()
275 			for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
276 				if (bad_ebs[i - eb])  in tort_init()
292 		for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
293 			if (bad_ebs[i - eb])  in tort_init()
295 			if ((eb + erase_cycles) & 1)  in tort_init()
312 			for (i = eb; i < eb + ebcnt; i++) {  in tort_init()
313 				if (bad_ebs[i - eb])  in tort_init()
315 				if ((eb + erase_cycles) & 1)  in tort_init()
329 					       ((eb + erase_cycles) & 1) ?  in tort_init()
340 		erase_cycles += 1;  in tort_init()
393  * Report the detailed information about how the read EB differs from what was
434 		len = ((first + bytes) | 0x7) + 1 - offset;  in report_corrupt()
458 			j1 += 1;  in print_bufs()
479 	int first = -1;  in countdiffs()
490 			bit = 1;  in countdiffs()
494 				bit <<= 1;  in countdiffs()